专利内容由知识产权出版社提供
专利名称：APPARATUS FOR MEASURING SPECULAR
REFLECTANCE OF A SAMPLE
发明人：Hoult, Robert Alan,Evetts, Paul Alexander申请号：EP04250265.8申请日：20040120公开号：EP1557652B1公开日：20190417
摘要：Attachment carries out the measurement sample of mirror-reflection forspectrometer. The attachment is designed to make all components that can be locatedat those of shell and sample jar are located at the horizontal method used andcomponent is arranged under the plane of shell plate. Component includes samplinglocation, and optical element analyzing radiation is directed to the sampling point anddetector receives the radiation reflected and removes from sample.
申请人：PerkinElmer Singapore PTE Limited
代理机构：Faulkner, Thomas John
更多信息请下载全文后查看
