专利内容由知识产权出版社提供
专利名称：Automatic Analysis Device
发明人：Daisuke EBIHARA,Kenta IMAI,Yoshihiro
YAMASHITA,Shigeki MATSUBARA,TakuSAKAZUME
申请号：US16329021申请日：20170804
公开号：US20190204346A1公开日：20190704
专利附图：
摘要：In order to aspire to higher sensitivity in an automatic analysis device, it isimportant to prevent the mixing of dust and the like in a reaction part in which a sample
and a reagent react. The present invention presents an automatic analysis device that isprovided with a configuration for making the pressure inside a specific block in the devicesuch as a reaction part, or inside the device become positive. By making the pressurebecome positive and forming an air flow that flows out from the inside of the reactionpart or the device, it is possible to limit, to a certain amount or less, the amount of dustpenetrating into the reaction part.
申请人：Hitachi High-Technologies Corporation
地址：Minato-ku, Tokyo JP
国籍：JP
更多信息请下载全文后查看
