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专利名称：Automatic test equipment operating
architecture
发明人：William A. Fritzsche申请号：US11422114申请日：20060605公开号：US074967B2公开日：20090224
专利附图：
摘要：An integrated circuit testing device, such as an ATE, configured with anarchitecture comprising a distinct software layer and a distinct hardware layer with aninterface for tester abstraction providing a communication conduit between the software
layer and the hardware layer. The software layer communicates in device under testterms whereas the hardware layer communicates in the terms of the testing apparatus.Various communication interface points are provided to the software and hardwarelayers, as well as the interface for tester abstraction.
申请人：William A. Fritzsche
地址：Morgan Hill CA US
国籍：US
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