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System and Method for Cleaning Semiconductor Fabri

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专利名称:System and Method for Cleaning

Semiconductor Fabrication Equipment Parts

发明人:Samantha Tan申请号:US142092申请日:20140313

公开号:US20140190937A1公开日:20140710

专利附图:

摘要:An exemplary embodiment discloses a process for cleaning semiconductorfabrication equipment parts with non-metallic surfaces. The process optionally includesproviding a semiconductor fabrication part with a non-metallic surface to be cleaned and

applying a dilute aqueous solution to remove contamination from the non-metallicsurface. The aqueous solution optionally includes dilute amounts of hydrofluoric acid,nitric acid and hydrogen peroxide. The dilute amounts would optionally be in the rangesof 0.5-1.5% wt. hydrofluoric acid, 0.1-0.5% wt. nitric acid and 1-10% wt. hydrogenperoxide.

申请人:QUANTUM GLOBAL TECHNOLOGIES LLC

地址:Dublin PA US

国籍:US

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