专利内容由知识产权出版社提供
专利名称：Method for measuring intensity distribution
of light
发明人：Kai-Li Jiang,Jun Zhu,Chen Feng,Shou-Shan
Fan
申请号：US13632420申请日：20121001公开号：US08471132B1公开日：20130625
专利附图：
摘要：A method for measuring intensity distribution of light is disclosed. The methodincludes the steps of manufacturing a superaligned carbon nanotube array arranged on a
substrate; irradiating a top surface of the superaligned carbon nanotube array with alight source and changing the morphology of the top surface of the superaligned carbonnanotube array; and obtaining an intensity distribution of the light source by analyzingthe morphology of the top surface of the superaligned carbon nanotube array.
申请人：Kai-Li Jiang,Jun Zhu,Chen Feng,Shou-Shan Fan
地址：Beijing CN,Beijing CN,Beijing CN,Beijing CN
国籍：CN,CN,CN,CN
代理机构：Altis Law Group, Inc.
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