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专利名称：Techniques for measurement of
deformation of electronically scannedantenna array structures
发明人：A. Vincent Mrstik申请号：US10612693申请日：20030702
公开号：US20050001760A1公开日：20050106
专利附图：
摘要：Techniques for simultaneous measurement of multiple array elements of anarray antenna. The array is illuminated with a coherent signal source, and each array
element phase shifter is cycled through a range of phase shifter settings at a unique rate.The phase shifted signals from each array element are combined to provide a compositesignal. The composite signal is processed to extract the phase of the coherent sourcesignal as received at each element. The phase information is used to determine thelocation of the elements relative to each other.
申请人：A. Vincent Mrstik
地址：Santa Barbara CA US
国籍：US
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