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专利名称：TEST CHIP AND TEST CHIP UNIT
INCORPORATED WITH TEST CHIP
发明人：Shigeru Wada申请号：US13982666申请日：20120118
公开号：US20130312546A1公开日：20131128
专利附图：
摘要：The present invention is characterized in being provided with a chip main body,which is provided with a flow channel having the end portion thereof opened in thesurface, and a sheet-like sealing member, which brings the inside of the flow channel into
a hermetically closed state by covering at least the opening in the surface of the chipmain body. The present invention is also characterized in that in the sealing member, aplurality of sheets are laminated, said sheets including a first sheet, which has ductilityand elasticity such that the first sheet can be penetrated by means of a nozzle member,and a second sheet having ductility lower than that of the first sheet, the sheets adjacentto each other are bonded with an adhesive agent or a cohesive agent, and that thesecond sheet is positioned further toward the chip main body side than the first sheet.
申请人：Shigeru Wada
地址：Kishiwada-shi JP
国籍：JP
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